G. Beltrame, C. Bolchini, L. Fossati, A. Miele, and D. Sciuto. A framework for reliability assessment and enhancement in multi-processor systems-on-chip. In Proc. of the 22nd IEEE Intl. Symposium on Defect and Fault-Tolerance in VLSI Systems, 2007. (DFT), 132–142. May 2007.
[BibTeX▼]


Contents © 2019 MIST Lab - Powered by Nikola
  • Follow us: